双晶直探头
Code: UFD-S□L□E□F□
适用于检测近表面与检测平行面或近似平行的缺陷
两个晶片一个发射一个接收
以探头直接接触工件表面的方式垂直入射纵波检测
近表面分辨力高, 盲区小
在焦距范围内可获得更高的灵敏度
| Code | Frequency | Focal length | Element size | Interface type |
|---|---|---|---|---|
| UFD-S□L□E□F□ | 5.0MHz (S6) | 5mm (L1), 10mm (L2), 15mm (L3), 20mm (L4), 25mm (L5), 30mm (L6) | Ø6mm (E1) | C6 (F1) |
| UFD-S□L□E□F□ | 2.5MHz (S4), 5.0MHz (S6) | 5mm (L1), 10mm (L2), 15mm (L3), 20mm (L4), 25mm (L5), 30mm (L6) | Ø10mm (E2) | C6 (F1) |
| UFD-S□L□E□F□ | 2.5MHz (S4), 5.0MHz (S6) | 5mm (L1), 10mm (L2), 15mm (L3), 20mm (L4), 25mm (L5), 30mm (L6) | Ø14mm (E3) | C6 (F1) |
| UFD-S□L□E□F□ | 1.0MHz (S1), 2.5MHz (S4), 5.0MHz (S6) | 5mm (L1), 10mm (L2), 15mm (L3), 20mm (L4), 25mm (L5), 30mm (L6) | Ø20mm (E4) | C6 (F1) |
| UFD-S□L□E□F□ | 1.0MHz (S1), 2.0MHz (S3), 4.0MHz (S5) | 5mm (L1), 10mm (L2), 15mm (L3), 20mm (L4), 25mm (L5), 30mm (L6) | 7×10mm (E7) | C5 (F3) |
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